Please use this identifier to cite or link to this item: http://repository.aaup.edu/jspui/handle/123456789/1166
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dc.contributor.authorA. F Qasrawi-
dc.date.accessioned2020-02-24T13:26:02Z-
dc.date.available2020-02-24T13:26:02Z-
dc.date.issued2014-
dc.identifier.citationVolume 89, Number 6en_US
dc.identifier.issnhttps://doi.org/10.1088/0031-8949/89/6/065802-
dc.identifier.urihttp://repository.aaup.edu/jspui/handle/123456789/1166-
dc.description.abstractAn Al/InSe/C Schottky device is designed on the surface of amorphous InSe thin films. The device is observed to exhibit a switching property at particular biasing voltages. The 'on/off' current ratio is found to be 7.9 and 9.3 at forward and reverse biasing voltages of 2.0 and 2.25 V, respectively. The 'off' and 'on' operational modes are ascribed to the domination of the tunneling of charged particles through a barrier height of 0.83 eV with a depletion region width of 64 nm and due to the domination of the thermionic emission of charged carriers over a barrier height of 0.53 eV, respectively. In addition, the spectral analysis of the capacitance of the device which was carried in the frequency range of 10.0 k-3.0 GHz reflected dc voltage biasing-dependent high quality resonating peaks. The strongest one appeared at a frequency of 36.8 MHz for a biasing voltage of 0.70 V. Furthermore, the loss tangent of the Al/InSe/C device is found to be of the order of 10(-7) at 3.0 GHz. Consistently, the capacitance-voltage spectra of these sensors reflected pronounced tunability up to 100 MHz. The Al/InSe/C device performance, the switching properties and the quality of the resonance peaks indicate the possibility of using these sensors in RF technology.en_US
dc.publisherPHYSICA SCRIPTAen_US
dc.subjectsemiconductor devicesen_US
dc.subjectInSeen_US
dc.subjectthin filmsen_US
dc.subjectRFen_US
dc.titleElectrical parameters of Al/InSe/C RF sensorsen_US
dc.typeArticleen_US
Appears in Collections:Faculty & Staff Scientific Research publications

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