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|Title:||Fabrication of (Au, Mn)/ZnPc/Ag Interfaces as Radiowave/Microwave Band Filters|
|Keywords:||Mn/ZnPC; X-ray diffraction; impedance spectra; band filters; return loss|
|Publisher:||Physica Status Solidi (a)- Wiley|
|Citation:||Phys. Status Solidi A 2020, 2000171|
|Abstract:||In the current study, Zinc phthalocyanine (ZnPc) layers are employed as active material to fabricated radiowave/microwave band filters. The thin layers of ZnPc are coated onto Au and Mn thin film substrates to form ohmic and Schottky interfaces, respectively. The Au/ZnPc and Mn/ZnPc devices are structurally and electrically characterized by means of X‐ray diffraction and impedance spectroscopy techniques in the frequency domain of 0.01‐1.80 GHz, respectively. The structural investigations have shown that both interfaces exhibited strained structures of the monoclinic phase of ZnPc. It was also observed that while the Au/ZnPc/Ag devices display negative capacitance (NC) effects in the microwave region above 1.46 GHz, the Mn/ZnPc/Ag devices show resonance‐antiresonance capacitive response in the radiowave region accompanied with NC effects in the range of 0.06‐1.80 GHz. In addition, analyses of the reflection coefficient spectra have shown the ability of the (Mn, Au)/ZnPc/Ag interfaces to behave as a typical high/low bandpass filters. The filters can be operated in microwaves and radiowave ranges. The return loss spectral investigations on these filters have shown their ability to reach the market standards.|
|Appears in Collections:||Faculty & Staff Scientific Research publications|
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