Growth and characterization of (glass, Ag)/SeO2 thin films

Abstract

Herein, thin films of SeO2 coated onto glass and Ag thin film substrates are studied and characterized. The films which are prepared by a vacuum evaporation technique, displayed Ag-metal induced crystallization process. The grown films are composed of tetragonal structure of SeO2 as major phase and orthorhombic as minor phase. The optical studies showed that the films exhibit an energy band gap of 3.69 eV. In addition, the analyses of the dielectric dispersion spectra indicated the nonlinear character of dielectric response. The SeO2 films response to oscillatory electromagnetic field is accompanied with drift mobility values in the range of 5.02–12.06 cm2/Vs. Moreover, polycrystalline SeO2 films coated onto Ag substrates are found appropriate for use as negative capacitance (NC) sources in the frequency domain of 0.41–1.80 GHz. Accompany with the NC effect, negative conductance (NG) effect was observed near 0.410 GHz and near 1.53 GHz.