Please use this identifier to cite or link to this item: http://repository.aaup.edu/jspui/handle/123456789/1764
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dc.contributor.authorQasrawi, Atef$AAUP$Palestinian-
dc.contributor.authorAlfhaid, Latifa$Other$Other-
dc.date.accessioned2024-01-21T07:43:14Z-
dc.date.available2024-01-21T07:43:14Z-
dc.date.issued2024-01-17-
dc.identifier.citationJournal of Ovonic Research , 20, (2024), 65-74en_US
dc.identifier.issnhttps://doi.org/10.15251/JOR.2024.201.65-
dc.identifier.urihttp://repository.aaup.edu/jspui/handle/123456789/1764-
dc.description.abstractHerein thin films of CrSe deposited by the thermal evaporation technique onto Pt substrates are designed as Schottky diodes. It is observed that the Pt/CrSe/C (PCC) Schottky diodes are of tunneling type showing barrier height and widths of 0.56 eV and 18 nm, respectively. These diodes displayed biasing dependent nonlinearity and negative slope of differential resistance. The analyses of the cutoff frequency spectra indicated that PCC devices can exhibit high cutoff frequency up to 17 GHz based on the driving signal frequency. The features of the PCC devices make it promising as electronic component suitable for 5G/6G technology applications.en_US
dc.language.isoenen_US
dc.publisherJournal of Ovonic Researchen_US
dc.relation.ispartofseries1842-2403;-
dc.subject: Pt/CrSe, Tunneling barriers, Microwaves, Cutoff frequency, 6G technologyen_US
dc.titlePerformance of PT/CRSE Schottky diodes designed for 5G/6G technology applicationsen_US
dc.typeArticleen_US
Appears in Collections:Faculty & Staff Scientific Research publications

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