Please use this identifier to cite or link to this item: http://repository.aaup.edu/jspui/handle/123456789/865
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dc.contributor.authorA. F Qasrawi-
dc.contributor.authornm.gasanly-
dc.date.accessioned2020-02-10T12:52:11Z-
dc.date.available2020-02-10T12:52:11Z-
dc.date.issued2002-
dc.identifier.urihttps://doi.org/10.1002/1521-4079(200206)37:6<587::AID-CRAT587>3.0.CO;2-Z-
dc.description.abstractSystematic dark electrical resistivity and Hall mobility measurements have been carried out in the temperature range 150-400 K on n-type GaS0.5Se0.5 layered crystals. The analysis of temperature dependent electrical resistivity and carrier concentration reveals the extrinsic type of conduction with a donor impurity level located at 0.44 eV, donor and acceptor concentrations of 3.4x10(17) and 4.1x10(17) cm(-1), respectively, and an electron effective mass of 0.41 m(o). The Hall mobility is limited by the electron-phonon short-range interactions scattering at high temperatures combined with the ionized impurity scattering at low temperatures. The electron-phonon short-range interactions scattering mobility analysis reveals an electron-phonon coupling constant of 0.25 and conduction band deformation potential of 5.57 eV/Angstrom.-
dc.publisherCRYSTAL RESEARCH AND TECHNOLOGY-
dc.subjectGaS0.5Se0.5 crystals; resistivity; Hall mobility; scattering mechanisms-
dc.titleCarrier scattering mechanisms in GaS0.5Se0.5 layered crystals-
dc.typeArticle-
Appears in Collections:Faculty & Staff Scientific Research publications

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